Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X‐ray Diffraction Technique

APA

Unknown. (2011) Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X‐ray Diffraction Technique. AIP Conference Proceedings.

MLA

Unknown. "Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X‐ray Diffraction Technique." AIP Conference Proceedings, 2011.

BibTeX

@article{2eb2d8e7,
  title = {Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X‐ray Diffraction Technique},
  author = {},
  year = {2011},
  journal = {AIP Conference Proceedings},
}